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[IEEE International Conference on Microelectronics - Beirut,Lebanon (11-13 Dec. 2002)] The 14th International Conference on Microelectronics, - Response of electrically active defects in P/sup +/N junctions when applying a magnetic field
Abdelaoui, M., Lamine, M., Idrissi-Benzohra, M., Benzohra, M., Ketata, M., Olivie, F.Year:
2002
Language:
english
DOI:
10.1109/icm-02.2002.1161502
File:
PDF, 318 KB
english, 2002