[IEEE 2010 23rd Annual Meeting of the IEEE Photonics...

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[IEEE 2010 23rd Annual Meeting of the IEEE Photonics Society (Formerly LEOS Annual Meeting) - Denver, CO, USA (2010.11.7-2010.11.11)] 2010 IEEE Photinic Society's 23rd Annual Meeting - Parametric discrimination between refractive index, temperature and strain using etched-core FBG

Lee, Sang-Mae, Saini, Simarjeet S., Jeong, Myung-Yung
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Year:
2010
Language:
english
DOI:
10.1109/photonics.2010.5698837
File:
PDF, 388 KB
english, 2010
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