[IEEE Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. (ISEIM 2005). - Kitakyushu, Japan (2005.06.5-2005.06.9)] Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. (ISEIM 2005). - Modeling and simulation of inner defect in impulse storage capacitor

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