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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Reliability investigations on a unique direct-tunneling-induced high performance partially-depleted SOI PMOS device
Shiao-Shien Chen,, Shiang Huang-Lu,, Tien-Hao Tang,, Wei-Tsun Shiau,Year:
2004
Language:
english
DOI:
10.1109/relphy.2004.1315448
File:
PDF, 154 KB
english, 2004