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[IEEE 2007 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2007.10.15-2007.10.18)] 2007 IEEE International Integrated Reliability Workshop Final Report - Comparison of Line stress predictions with measured electromigration failure times

Morusupalli, Rao R., Nix, William D., Patel, Jamshed R.
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Year:
2007
Language:
english
DOI:
10.1109/irws.2007.4469237
File:
PDF, 106 KB
english, 2007
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