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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Session 34: Memory technology - nanoscale poly-FG and charge trap flash non-volatile memories
Tejas Krishnamohan,, Jong-Ho Lee,Year:
2008
Language:
english
DOI:
10.1109/iedm.2008.4796824
File:
PDF, 101 KB
english, 2008