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[IEEE 2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering (SIBIRCON) - Novosibirsk, Russia (2008.07.21-2008.07.25)] 2008 IEEE Region 8 International Conference on Computational Technologies in Electrical and Electronics Engineering - Composite combinatorial scheme of test planning (example for microprocessor systems)
Levin, Mark Sh., Merzlyakov, Alexey O.Year:
2008
Language:
english
DOI:
10.1109/sibircon.2008.4602579
File:
PDF, 261 KB
english, 2008