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[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA, USA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - Statistical VTH shift variation self-convergence scheme using near threshold VWL injection for local electron injected asymmetric pass gate transistor SRAM

Miyaji, Kousuke, Shinozuka, Yasuhiro, Miyano, Shinji, Takeuchi, Ken
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Year:
2011
Language:
english
DOI:
10.1109/cicc.2011.6055422
File:
PDF, 1.45 MB
english, 2011
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