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[IEEE 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) - Santa Barbara, CA, USA (27-31 March 1994)] Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM) - Assessment of the structural parameters of GaInAs/GaInAsP strained layer multiquantum wells by X-ray diffraction
de Miguel, J.L., Gomez-Salas, E., Martin, J.L.Year:
1994
Language:
english
DOI:
10.1109/iciprm.1994.328171
File:
PDF, 339 KB
english, 1994