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[IEEE 2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems (MEMS) - Sorrento, Italy (2009.01.25-2009.01.29)] 2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems - Monolithic Multicolor Total Internal Reflection (TIR)-Based Chip for Highly-Sensitive Multifluorescence Detection and Imaging
Le, Nam Cao Hoai, Dao, Dzung Viet, Yokokawa, Ryuji, Wells, John, Sugiyama, SusumuYear:
2009
Language:
english
DOI:
10.1109/memsys.2009.4805557
File:
PDF, 2.97 MB
english, 2009