[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - Development of early process control indicators for reliability drop test performance of eWLB products
Azevedo, Alexandre, Cardoso, Andre, Teixeira, Jorge, Tavares, Oriza, Marques, RuiYear:
2012
Language:
english
DOI:
10.1109/ectc.2012.6248920
File:
PDF, 930 KB
english, 2012