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[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Predicting TEM cell measurements from near field scan data
Haixiao Weng,, Beetner, D.G., DuBroff, R.E.Year:
2006
Language:
english
DOI:
10.1109/isemc.2006.1706371
File:
PDF, 326 KB
english, 2006