[IEEE 2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers - Forth Worth, TX, USA (6-8 June 2004)] 2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers - Reliability evaluation of Gilbert cell mixer based on a hot-carrier stressed device degradation model
Wei-Cheng Lin,, Long-Jei Du,, Ya-Chin King,Year:
2004
Language:
english
DOI:
10.1109/rfic.2004.1320630
File:
PDF, 227 KB
english, 2004