IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2007 / 06 Vol. 26; Iss. 6
A Novel Optimization Method for Parametric Yield: Uniform Design Mapping Distance Algorithm
Jing, Ming-e, Hao, Yue, Zhou, Dian, Zeng, XuanVolume:
26
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2006.885833
Date:
June, 2007
File:
PDF, 413 KB
english, 2007