[IEEE 2000 IEEE Ultrasonics Symposium. Proceedings. An International Symposium - San Juan, Puerto Rico (22-25 Oct. 2000)] 2000 IEEE Ultrasonics Symposium. Proceedings. An International Symposium (Cat. No.00CH37121) - AlN and GaN layers deposited on sapphire or silicon substrates: theory and experiment
Pastureaud, Th., Soufyane, A., Camou, S., Ballandras, S., Schenck, D., Semond, F., Desbois, J., Laude, V.Volume:
1
Year:
2000
Language:
english
DOI:
10.1109/ULTSYM.2000.922559
File:
PDF, 3.76 MB
english, 2000