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Spatially confined electric field effect for improved resistive switching behavior of a Ni/Ta-embedded TaO x /NiSi device
Park, Jingyu, Jeon, Heeyoung, Kim, Hyunjung, Jang, Woochool, Seo, Hyungtak, Jeon, HyeongtagVolume:
4
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/c4ra10446c
Date:
November, 2014
File:
PDF, 541 KB
english, 2014