[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Comparison of field electron emission from carbon nanotube films produced by different techniques
Karabutov, A.V., Konov, V.I., Obraztsova, E.D., Pereverzev, V.G., Pimenov, S.M., Pozharov, A.S., Terekhov, S.V., Detkov, P.Y., Shorokhov, E.V., Loubnin, E.N.Year:
2003
Language:
english
DOI:
10.1109/IVMC.2003.1223068
File:
PDF, 173 KB
english, 2003
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