[IEEE 2010 IEEE 8th International Symposium on Applied Machine Intelligence and Informatics (SAMI) - Herlany, Slovakia (2010.01.28-2010.01.30)] 2010 IEEE 8th International Symposium on Applied Machine Intelligence and Informatics (SAMI) - Scoliosis testing features on the basis of electronically generated moire patterns
Gaal, Zselyke, Antal, Akos, Tamas, PeterYear:
2010
Language:
english
DOI:
10.1109/sami.2010.5423706
File:
PDF, 877 KB
english, 2010