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[IEEE 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Ipoh, Perak, Malaysia (2012.11.6-2012.11.8)] 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Effect of die attach adhesive defects on the junction temperature uniformity of LED chips
Tao, Mian, Lee, S. W. Ricky, Yuen, Matthew M. F., Guoqi Zhang,, van Driel, WillemYear:
2012
Language:
english
DOI:
10.1109/iemt.2012.6521830
File:
PDF, 2.61 MB
english, 2012