[IEEE 2008 IEEE International Conference on Electro/Information Technology (EIT 2008) - Ames, IA, USA (2008.05.18-2008.05.20)] 2008 IEEE International Conference on Electro/Information Technology - Module Prototype for Online Failure Prediction for the IBM Blue Gene/L
Solano-Quinde, Lizandro D., Bode, Brett M.Year:
2008
Language:
english
DOI:
10.1109/eit.2008.4554349
File:
PDF, 104 KB
english, 2008