[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Efficiently Utilizing ATE Vector Repeat for Compression by Scan Vector Decomposition
Lee, Jinkyu, Touba, NurYear:
2006
Language:
english
DOI:
10.1109/ats.2006.261026
File:
PDF, 208 KB
english, 2006