[IEEE 2009 3rd International Conference on Signals,...

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[IEEE 2009 3rd International Conference on Signals, Circuits and Systems (SCS 2009) - Medenine, Tunisia (2009.11.6-2009.11.8)] 2009 3rd International Conference on Signals, Circuits and Systems (SCS) - Feature Selection using an SVM learning machine

El Ferchichi, Sabra, Laabidi, Kaouther, Zidi, Salah, Maouche, Salah
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Year:
2009
Language:
english
DOI:
10.1109/icscs.2009.5412341
File:
PDF, 342 KB
english, 2009
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