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[IEEE 1999 Proceedings. 49th Electronic Components and Technology Conference - San Diego, CA, USA (1-4 June 1999)] 1999 Proceedings. 49th Electronic Components and Technology Conference (Cat. No.99CH36299) - Performance and reliability of oxide confined VCSELs
Wipiejewski, T., Wolf, H.D., Korte, L., Huber, W., Kristen, G., Hoyler, C., Hedrich, H., Kleinbub, O., Popp, M., Kaindl, J., Rieger, A., Albrecht, T., Mueller, J., Orth, A., Spika, Z., Lutgen, S., PflYear:
1999
Language:
english
DOI:
10.1109/ectc.1999.776264
File:
PDF, 447 KB
english, 1999