[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - Observation and Effective Suppression of Dielectric Relaxation in Charge-Trap NAND Flash Memory
Sim, Jae Sung, Choi, Jungdal, Kang, Changseok, Park, Youngwoo, Park, Jintaek, Choi, Jeong-Hyuk, Chung, ChilheeYear:
2011
Language:
english
DOI:
10.1109/imw.2011.5873237
File:
PDF, 488 KB
english, 2011