[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Scaling reliability and modeling of ferroelectric capacitors
Acosta, Antonio G., Rodriguez, John, Obradovic, Borna, Summerfelt, Scott, San, Tamer, Green, Keith, Moise, Ted, Krishnan, SrikanthYear:
2010
Language:
english
DOI:
10.1109/irps.2010.5488748
File:
PDF, 495 KB
english, 2010