Investigation of Nonswitching Regions in Ferroelectric Thin...

Japanese Journal of Applied Physics 2000 / 6 Vol. 39; Iss. Part 1, No

Investigation of Nonswitching Regions in Ferroelectric Thin Films Using Scanning Force Microscopy

Saya, Yuko, Watanabe, Shunji, Kawai, Maki, Yamada, Hirofumi, Matsushige, Kazumi
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Volume:
39
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.39.3799
Date:
June, 2000
File:
PDF, 235 KB
english, 2000
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