[IEEE 2012 70th Annual Device Research Conference (DRC) - University Park, PA, USA (2012.06.18-2012.06.20)] 70th Device Research Conference - Flicker noise characterization and analytical modeling of homo and hetero-junction III–V tunnel FETs
Bijesh, R., Mohata, D. K., Liu, H., Datta, S.Year:
2012
Language:
english
DOI:
10.1109/drc.2012.6257032
File:
PDF, 1.04 MB
english, 2012