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[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - System models of metrological support and manufacturing control
Palchun, Yu. A., Yelistratova, I. B.Year:
2012
Language:
english
DOI:
10.1109/apeie.2012.6629147
File:
PDF, 459 KB
english, 2012