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[IEEE 2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Graz, Austria (2012.05.13-2012.05.16)] 2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings - Bit error rate measurement system for RF integrated circuits
Hsiao, Hsu-Feng, Lin, Shuw-Guann, Su, Sy-Haur, Tu, Chih-Ho, Chang, Da-Chiang, Juang, Ying-Zong, Chiou, Hwann-KaeoYear:
2012
Language:
english
DOI:
10.1109/i2mtc.2012.6229204
File:
PDF, 1.49 MB
english, 2012