A Scalable RFCMOS Noise Model

IEEE Transactions on Microwave Theory and Techniques 2009 / 05 Vol. 57; Iss. 5

A Scalable RFCMOS Noise Model

Tong, A.F., Wei Meng Lim,, Yeo, K.S., Choon Beng Sia,, Wen Cong Zhou,
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Volume:
57
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/tmtt.2009.2017245
Date:
May, 2009
File:
PDF, 2.09 MB
english, 2009
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