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[IEEE 2005 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. - Monterey, CA (July 24-28, 2005)] Proceedings, 2005 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. - Laser beam raster scan under variable process speed - an application of time varying model reference repetitive control system
Junqing Wang,, Tsu-Chin Tsao,Year:
2005
Language:
english
DOI:
10.1109/aim.2005.1511179
File:
PDF, 550 KB
english, 2005