[IEEE 28th International Electronics Manufacturing Technology Symposium - San Jose, CA, USA (16-18 July 2003)] IEEE/CPMT/SEMI 28th International Electronics Manufacturing Technology Symposium, 2003. IEMT 2003. - New test approaches for zero-IF transceiver devices
Lukez, J.Year:
2003
Language:
english
DOI:
10.1109/iemt.2003.1225937
File:
PDF, 266 KB
english, 2003