Study of bending-induced strain effects on MuGFET...

IEEE Electron Device Letters 2006 / 08 Vol. 27; Iss. 8

Study of bending-induced strain effects on MuGFET performance

Shin, K., Weize,, Chung Yeung Cho,, Cleavelin, C.R., Schulz, T., Schruefer, K., Patruno, P., Smith, L., Tsu-Jae King Liu,
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Volume:
27
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2006.878047
Date:
August, 2006
File:
PDF, 316 KB
english, 2006
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