[IEEE 2007 Proceedings 57th Electronic Components and Technology Conference - Sparks, NV, USA (2007.05.29-2007.06.1)] 2007 Proceedings 57th Electronic Components and Technology Conference - Low-K Flip Chip Board Level Reliability on 65nm Technology
Tsao, Pei-Haw, Kiang, Bill, Wu, Kenneth, Chang, Abel, Yuan, Tsorng-DihYear:
2007
Language:
english
DOI:
10.1109/ectc.2007.373784
File:
PDF, 5.37 MB
english, 2007