[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Assessing the degradation mechanisms and current limitation design rules of SiCr-based thin-film resistors in integrated circuits
Li, Yuan, Donnet, David, Grzegorczyk, Andrzej, Cavelaars, Jan, Kuper, FredYear:
2010
Language:
english
DOI:
10.1109/irps.2010.5488742
File:
PDF, 392 KB
english, 2010