![](/img/cover-not-exists.png)
[IEEE 2010 IEEE International Conference on Robotics and Automation (ICRA 2010) - Anchorage, AK (2010.05.3-2010.05.7)] 2010 IEEE International Conference on Robotics and Automation - An integrated probabilistic model for scan-matching, moving object detection and motion estimation
van de Ven, Joop, Ramos, Fabio, Tipaldi, Gian DiegoYear:
2010
Language:
english
DOI:
10.1109/robot.2010.5509586
File:
PDF, 948 KB
english, 2010