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[IEEE 2010 Annual Reliability and Maintainability Symposium (RAMS) - San Jose, CA, USA (2010.01.25-2010.01.28)] 2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) - Reliability estimation for one-shot systems with zero component test failures
Guo, Huairui, Honecker, Sharon, Mettas, Adamantios, Ogden, DougYear:
2010
Language:
english
DOI:
10.1109/rams.2010.5448016
File:
PDF, 290 KB
english, 2010