[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Development and validation of a microcontroller model for EMC
Li, Shaohua, Bishnoi, Hemant, Whiles, Jason, Ng, Pius, Weng, Haixiao, Pommerenke, David, Beetner, DarylYear:
2008
Language:
english
DOI:
10.1109/emceurope.2008.4786860
File:
PDF, 378 KB
english, 2008