[Japan Soc. Promotion of Sci International Vacuum...

[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Comparison field emission cathodes characteristics utilizing working area and field enhancement factor parameters

Nikolski, K.N., Baturin, A.S., Bormashov, V.S., Tchesov, R.G., Trufanov, A.I., Sheshin, E.P., Sharov, V.B.

How much do you like this book?

What’s the quality of the file?

Download the book for quality assessment

What’s the quality of the downloaded files?

Year:

2003

Language:

english

DOI:

10.1109/ivmc.2003.1222998

File:

PDF, 117 KB

english, 2003

Conversion to is in progress

Conversion to is failed