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[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Hafnium Silicate Gate Insulators in Field Effect Sensors Used to Detect DNA Hybridization
Jiang, Weihong, Landheer, Dolf, Lopinski, Gregory, McKinnon, W.Ross, Rankin, Alasdair, Ghias-Begloo, Ehsan, Griffin, Ryan, Tarr, N. Garry, Tait, Niall, Liu, Jian, Lennard, WilliamVolume:
16
Year:
2008
Language:
english
DOI:
10.1149/1.2981149
File:
PDF, 125 KB
english, 2008