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Takagi–Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products
Ying Zheng,, Wong, David Shan-Hill, Yan-Wei Wang,, Huajing Fang,Volume:
44
Language:
english
Journal:
IEEE Transactions on Cybernetics
DOI:
10.1109/tcyb.2013.2280908
Date:
July, 2014
File:
PDF, 11.11 MB
english, 2014