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[IEEE 2014 IEEE 11th International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2014.8.27-2014.8.29)] 2014 IEEE International Conference on Semiconductor Electronics (ICSE2014) - Effect of process parameter variability on the threshold voltage of downscaled 22nm PMOS using taguchi method
Maheran, A. H. Afifah, Menon, P.S., Shaari, S., Kalaivani, T., Ahmad, I., Faizah, Z. A. Noor, Apte, P. R.Year:
2014
Language:
english
DOI:
10.1109/smelec.2014.6920825
File:
PDF, 1.14 MB
english, 2014