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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - Architecture for Testing Multi-Voltage Domain SOC
Souef, L., Eychenne, C., Alie, E.Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700592
File:
PDF, 6.25 MB
english, 2008