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[IEEE IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (1-3 May 1990)] IEEE International Symposium on Circuits and Systems - Built-in test using perturbed deterministic patterns
Wu, D.M., Waicukauski, J.Year:
1990
Language:
english
DOI:
10.1109/iscas.1990.112326
File:
PDF, 305 KB
english, 1990