![](/img/cover-not-exists.png)
[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - Triple-self-aligned, planar double-gate MOSFETs: devices and circuits
Guarini, K.W., Solomon, P.M., Zhang, Y., Chan, K.K., Jones, E.C., Cohen, G.M., Krasnoperova, A., Ronay, M., Dokumaci, O., Bucchignano, J.J., Cabral, C., Lavoie, C., Ku, V., Boyd, D.C., Petrarca, K.S.,Year:
2001
Language:
english
DOI:
10.1109/iedm.2001.979527
File:
PDF, 731 KB
english, 2001