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[IEEE 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Stresa, Italy (2007.06.11-2007.06.12)] 2007 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Enabling Effective Yield Learning through Actual DFM-Closure at the SoC Level
Appello, Davide, Tancorre, VincenzoYear:
2007
Language:
english
DOI:
10.1109/asmc.2007.375103
File:
PDF, 293 KB
english, 2007