[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Characterization of Electromigration Parameters on Single Device
Doyen, L., Federspiel, X., Ney, D., Petitprez, E., Girault, V., Arnaud, L., Wouters, Y.Year:
2007
Language:
english
DOI:
10.1109/relphy.2007.369988
File:
PDF, 391 KB
english, 2007