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[IEEE 2008 26th International Conference on Microelectronics (MIEL 2008) - Nis, Serbia and Montenegro (2008.05.11-2008.05.14)] 2008 26th International Conference on Microelectronics - New approach in estimating the lifetime in NBT stressed P-channel power VDMOSFETs
Dankovic, D., Manic, I., Davidovic, V., Djoric-Veljkovic, S., Golubovic, S., Stojadinovic, N.Year:
2008
Language:
english
DOI:
10.1109/icmel.2008.4559357
File:
PDF, 584 KB
english, 2008