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[IEEE TENCON 2009 - 2009 IEEE Region 10 Conference - Singapore (2009.01.23-2009.01.26)] TENCON 2009 - 2009 IEEE Region 10 Conference - Statistical reach feature method and its application to robust image registration
Ozaki, Ryushi, Satoh, Yutaka, Iwata, Kenji, Sakaue, KatsuhikoYear:
2009
Language:
english
DOI:
10.1109/tencon.2009.5395884
File:
PDF, 926 KB
english, 2009