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[ESD Assoc 18th Annual Electrical Overstress/Electrostatic Discharge Symposium - Orlando, FL, USA (10-12 Sept. 1996)] Proceedings Electrical Overstress/Electrostatic Discharge Symposium - A combined socketed and non-socketed CDM test approach for eliminating real-world CDM failures
Olney, A.Year:
1996
Language:
english
DOI:
10.1109/eosesd.1996.865127
File:
PDF, 1.48 MB
english, 1996